Scanning Electron Microscopy (SEM)
- Scanning electron microscopy (SEM- BSE- EDS).
- The scanning electron microscope (SEM) allows the obtention of high-resolution images by means of an electron beam focused on the sample to be studied, scanning its surface.
Scanning Electron Microscopy (FEGSTEM- EDX, BSE, EBSD)
- Scanning Electron Microscopy (Field Emission Gun) (FEGSTEM- EDX, BSE, EBSD).
- Schottky Field Emission Gun (FEG)
- Accelerating voltage up until 30 kV
- Magnificacion: 10x-100000x
- Resolution with Se: 1.2 nm
- Resolution with BSE : 3.5 nm
Scanning Auger Microprobe
- Scanning Auger Microprobe ,Including in-situ fracture studies, one by impact (cooling of the specimen at liquid nitrogen temperature) and the other by tension.
X-ray Photoelectron Spectroscopy (XPS/ESCA)
- X-ray photoelectron spectroscopy (XPS/ESCA).
Transmission Electron Microscope (TEM) JEOL JEM 2010
- Transmsion electron microscopy is a powerful technique that uses an electron beam that is transmitted through a solid (an ultra-fine sample, about 100 nm) to form an image. This technique gives information about the microstructure and morfology of the samples studied.
- Features:
- Here at CIEMAt, we have aTEM model JEOL JEM 2010 TEM microscope, with an acceleration voltage of 200 kV and a thermoionic electron gun with filament of LaB6.
- It also has some accesories for the different analysis that can be carried on.
- This microscope is situated inside a radioactive installation, which allows for the study of both, irradiated and non-irradiated samples.
TEM Sample Preparation Laboratory
- Sample preparation is an important aspect of TEM analysis, as a TEM sample must be fine enough for electrons to pass through it and form an image.
- the samples go through several processes of cutting, smoothing and polishing to achieve electronic transparency.
